Optical Light Microscope

The optical light microscope MeF4M is used for examination of flat surfaces and for examination of materiallographic and metallographic sections. This research into the microstructure of materials.

In addition, using the connected image analysis system, it is possible to quantitatively characterise any image with sufficient contrast.

An optical light macroscope is connected to the same system. This provides a magnification range of 3-1500x. The lateral resolution is up to about 0.5µm.

Optical microscopy/macroscopy and SEM, Scanning Electron Microscope are complementary techniques used in combination.

magnifications 20 to 1500x

resolution up to 0.5µm

Sample size: basically unlimited in width, length and height

Sample weight up to a maximum of 5kg.

Olympus PRECiV image analysis system: area (volume) measurement, length and width measurements, image processing, stitching of images, EFI (Extended Focus Imaging) for a sharp image over the entire height of a sample.

Bright field

Dark field

Nomarski Interference contrast

Polarised light

SEM, scanning electron microscopy

Optical Macroscopy

Failure analysis

Corrosion survey

Wear, tribological examination

Characterisation of various cross-sections and surfaces:

Electrolysis

Biomass

Solar cell development

Fractography and Fracture Surface Investigation

Crack examination, crack progression

Microstructures of materials