SEM in situ tensile & compression module

This in situ tensile and compression module is a deformation device for the scanning electron microscope that fits on the specimen stage like a large specimen. The deformation of the specimens can be monitored in situ during compression or tension. Specimens can be from 30 to 60 mm length, up to 10 mm wide and up to 4 mm high.

Specimens can be from 30 to 60 mm length, up to 10 mm wide and up to 4 mm high. Compression and tension is possible up to 10 kN. The system can also perform cyclic tests with a frequency up to 0,1 Hz.

The tensile and compression module is intended for use in combination with an electron microscope (see NovaNanoSEM 650). However, it is not limited to use with electron microscopy, it could be placed under an optical/digital microscope, laser microscope, AFM or Raman microscope.

The tensile and compression module can be used for static or dynamic observations of surface changes under controlled mechanical load, crack growth, delamination phenomenae, formation of slip planes etc. and can be used on a wide variety of specimen types.